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@ARTICLE{Azzouzi:877888,
      author       = {Azzouzi, Mohammed and Calado, Philip and Telford, Andrew M.
                      and Eisner, Flurin and Hou, Xueyan and Kirchartz, Thomas and
                      Barnes, Piers R. F. and Nelson, Jenny},
      title        = {{O}vercoming the {L}imitations of {T}ransient
                      {P}hotovoltage {M}easurements for {S}tudying {R}ecombination
                      in {O}rganic {S}olar {C}ells},
      journal      = {Solar RRL},
      volume       = {4},
      number       = {5},
      issn         = {2367-198X},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {FZJ-2020-02493},
      pages        = {1900581},
      year         = {2020},
      abstract     = {Transient photovoltage (TPV) measurements are frequently
                      used to study recombination processes in thin‐film solar
                      cells by probing the decay of a small optically induced
                      voltage perturbation to infer the charge carrier dynamics of
                      devices at open circuit. However, the validity of this
                      method to probe organic semiconductors has recently come
                      into doubt due to large discrepancies in the reported
                      carrier lifetime values for the same systems and the
                      reporting of unrealistic reaction order values. Herein, the
                      validity of TPV to extract reliable charge carrier lifetimes
                      in thin‐film solar cells is explored through the use of
                      time‐dependent drift‐diffusion simulations and
                      measurements. It is found that in low‐mobility materials,
                      TPV serves primarily as a probe of charge carrier
                      redistribution in the bulk rather than bulk recombination
                      dynamics and that the extracted time constant is highly
                      mobility dependent. To address this shortcoming, transient
                      photocharge, a new technique to measure the charge carrier
                      density during photovoltage decay, is introduced and applied
                      to study the recombination dynamics in a series of
                      (fullerene and nonfullerene) organic solar cell systems. It
                      is shown that using this technique the charge carrier
                      recombination lifetime in the active layer is more
                      accurately determined.},
      cin          = {IEK-5},
      ddc          = {600},
      cid          = {I:(DE-Juel1)IEK-5-20101013},
      pnm          = {121 - Solar cells of the next generation (POF3-121)},
      pid          = {G:(DE-HGF)POF3-121},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000520749600001},
      doi          = {10.1002/solr.201900581},
      url          = {https://juser.fz-juelich.de/record/877888},
}