%0 Book Section
%A Förster, Beate
%T Scanning Electron Microscopy
%V 190
%C Zentralbibliothek
%I Forschungszentrum Jülich GmbH
%M FZJ-2020-02691
%B Verlag, Schriften des Forschungszentrums Jülich Reihe Schlüsseltechnologien / Key Technologies
%P F4.2-F4.12
%D 2019
%< Scattering! Soft Functional and Quantum Materials
%B 50th IFF Spring School 2019
%C 11 Mar 2019 - 22 Mar 2019,  (Germany)
Y2 11 Mar 2019 - 22 Mar 2019
M2 , Germany
%F PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
%9 Contribution to a conference proceedingsContribution to a book
%U https://juser.fz-juelich.de/record/878203