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@ARTICLE{Almeida:878234,
      author       = {Almeida, Trevor P. and McGrouther, Damien and Kovács,
                      András and Dunin-Borkowski, Rafal E. and McVitie, Stephen},
      title        = {{F}ocused {E}lectron-{B}eam {I}nduced {D}eposition, {I}n
                      {S}itu {TEM} {A}nd {O}ff-{A}xis {E}lectron {H}olography
                      {I}nvestigation of {B}i-{M}agnetic {C}ore-{S}hell
                      {N}anostructures},
      journal      = {Microscopy and microanalysis},
      volume       = {25},
      number       = {S2},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2020-02703},
      pages        = {56 - 57},
      year         = {2019},
      cin          = {ER-C-1},
      ddc          = {500},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.1017/S1431927619001016},
      url          = {https://juser.fz-juelich.de/record/878234},
}