TY  - JOUR
AU  - Voelkl, E.
AU  - Zheng, F.
AU  - Migunov, V.
AU  - Beleggia, M.
AU  - Dunin-Borkowski, R. E.
TI  - Live Measurement of Electrical Charge Density in Materials using Off-Axis Electron Holography
JO  - Microscopy and microanalysis
VL  - 25
IS  - S2
SN  - 1435-8115
CY  - New York, NY
PB  - Cambridge University Press
M1  - FZJ-2020-02705
SP  - 44 - 45
PY  - 2019
LB  - PUB:(DE-HGF)16
DO  - DOI:10.1017/S1431927619000953
UR  - https://juser.fz-juelich.de/record/878236
ER  -