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@ARTICLE{Voelkl:878236,
      author       = {Voelkl, E. and Zheng, F. and Migunov, V. and Beleggia, M.
                      and Dunin-Borkowski, R. E.},
      title        = {{L}ive {M}easurement of {E}lectrical {C}harge {D}ensity in
                      {M}aterials using {O}ff-{A}xis {E}lectron {H}olography},
      journal      = {Microscopy and microanalysis},
      volume       = {25},
      number       = {S2},
      issn         = {1435-8115},
      address      = {New York, NY},
      publisher    = {Cambridge University Press},
      reportid     = {FZJ-2020-02705},
      pages        = {44 - 45},
      year         = {2019},
      cin          = {ER-C-1},
      ddc          = {500},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)
                      / SIMDALEE2 - Sources, Interaction with Matter, Detection
                      and Analysis ofLow Energy Electrons 2 (606988)},
      pid          = {G:(DE-HGF)POF3-143 / G:(EU-Grant)606988},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.1017/S1431927619000953},
      url          = {https://juser.fz-juelich.de/record/878236},
}