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@ARTICLE{Hu:878249,
author = {Hu, Guangliang and Wu, Jingying and Ma, Chunrui and Liang,
Zhongshuai and Liu, Weihua and Liu, Ming and Wu, Judy Z. and
Jia, Chun-Lin},
title = {{C}ontrolling the {D}irac point voltage of graphene by
mechanically bending the ferroelectric gate of a graphene
field effect transistor},
journal = {Materials Horizons},
volume = {6},
number = {2},
issn = {2051-6355},
address = {Cambridge},
publisher = {RSC Publ.},
reportid = {FZJ-2020-02718},
pages = {302 - 310},
year = {2019},
abstract = {Controlling the Dirac point voltage of graphene is
essential for realizing various practical applications of
graphene. Here, control of the doping state is achieved in
flexible graphene field effect transistors (GFETs) by
applying mechanical bending stress. By gradually increasing
the bending strain (the decrease of upward/downward bending
radius), the Dirac point (VDirac) linearly shifts to
left/right, which is induced by the flexoelectric effect of
the ferroelectric Pb0.92La0.08Zr0.52Ti0.48O3 (PLZT) gate. In
addition, a superior mechanical antifatigue character is
obtained in the flexible GFETs, and the doping effect is
recoverable. The sensitivity to strain and high bending
stability not only offer an easy, controllable and
nonintrusive method to obtain a specific doping level in
graphene for flexible electric devices, but also highlight
the enormous potential of the flexible ferroelectric
PLZT-gated GFETs as wearable sensors.},
cin = {ER-C-1},
ddc = {540},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
pid = {G:(DE-HGF)POF3-143},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000459726900021},
doi = {10.1039/C8MH01499J},
url = {https://juser.fz-juelich.de/record/878249},
}