%0 Conference Paper
%A Grieb, Tim
%A Müller-Caspary, Knut
%A Van Aert, Sandra
%A Eickhoff, Martin
%A Soltau, Heike
%A Rosenauer, Andreas
%A Müßener, Jan
%A Gauquelin, Nicolas
%A Ritz, Robert
%A Simson, Martin
%A Hille, Pascal
%A Schörmann, Jörg
%A Verbeeck, Johan
%T Measuring polarization induced electric fields in AlGaN/GaN nanowires using nano-beam electron diffraction and momentum-resolved 4D-STEM”
%M FZJ-2020-02744
%D 2019
%B 21st International Conference on Microscopy of Semiconducting Materials
%C 9 Apr 2020 - 12 Apr 2020, Cambridge (UK)
Y2 9 Apr 2020 - 12 Apr 2020
M2 Cambridge, UK
%F PUB:(DE-HGF)6
%9 Conference Presentation
%U https://juser.fz-juelich.de/record/878281