TY  - CONF
AU  - Grieb, Tim
AU  - Müller-Caspary, Knut
AU  - Van Aert, Sandra
AU  - Eickhoff, Martin
AU  - Soltau, Heike
AU  - Rosenauer, Andreas
AU  - Müßener, Jan
AU  - Gauquelin, Nicolas
AU  - Ritz, Robert
AU  - Simson, Martin
AU  - Hille, Pascal
AU  - Schörmann, Jörg
AU  - Verbeeck, Johan
TI  - Measuring polarization induced electric fields in AlGaN/GaN nanowires using nano-beam electron diffraction and momentum-resolved 4D-STEM”
M1  - FZJ-2020-02744
PY  - 2019
T2  - 21st International Conference on Microscopy of Semiconducting Materials
CY  - 9 Apr 2020 - 12 Apr 2020, Cambridge (UK)
Y2  - 9 Apr 2020 - 12 Apr 2020
M2  - Cambridge, UK
LB  - PUB:(DE-HGF)6
UR  - https://juser.fz-juelich.de/record/878281
ER  -