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@INPROCEEDINGS{Grieb:878281,
      author       = {Grieb, Tim and Müller-Caspary, Knut and Van Aert, Sandra
                      and Eickhoff, Martin and Soltau, Heike and Rosenauer,
                      Andreas and Müßener, Jan and Gauquelin, Nicolas and Ritz,
                      Robert and Simson, Martin and Hille, Pascal and Schörmann,
                      Jörg and Verbeeck, Johan},
      title        = {{M}easuring polarization induced electric fields in
                      {A}l{G}a{N}/{G}a{N} nanowires using nano-beam electron
                      diffraction and momentum-resolved 4{D}-{STEM}”},
      reportid     = {FZJ-2020-02744},
      year         = {2019},
      month         = {Apr},
      date          = {2020-04-09},
      organization  = {21st International Conference on
                       Microscopy of Semiconducting Materials,
                       Cambridge (UK), 9 Apr 2020 - 12 Apr
                       2020},
      subtyp        = {Other},
      cin          = {ER-C-1},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {143 - Controlling Configuration-Based Phenomena (POF3-143)},
      pid          = {G:(DE-HGF)POF3-143},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/878281},
}