001     878281
005     20210130005533.0
037 _ _ |a FZJ-2020-02744
041 _ _ |a English
100 1 _ |a Grieb, Tim
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111 2 _ |a 21st International Conference on Microscopy of Semiconducting Materials
|c Cambridge
|d 2020-04-09 - 2020-04-12
|w UK
245 _ _ |a Measuring polarization induced electric fields in AlGaN/GaN nanowires using nano-beam electron diffraction and momentum-resolved 4D-STEM”
260 _ _ |c 2019
336 7 _ |a Conference Paper
|0 33
|2 EndNote
336 7 _ |a Other
|2 DataCite
336 7 _ |a INPROCEEDINGS
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336 7 _ |a conferenceObject
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336 7 _ |a LECTURE_SPEECH
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336 7 _ |a Conference Presentation
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536 _ _ |a 143 - Controlling Configuration-Based Phenomena (POF3-143)
|0 G:(DE-HGF)POF3-143
|c POF3-143
|f POF III
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700 1 _ |a Müller-Caspary, Knut
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700 1 _ |a Van Aert, Sandra
|0 P:(DE-HGF)0
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700 1 _ |a Eickhoff, Martin
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700 1 _ |a Soltau, Heike
|0 P:(DE-HGF)0
|b 4
700 1 _ |a Rosenauer, Andreas
|0 P:(DE-HGF)0
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700 1 _ |a Müßener, Jan
|0 P:(DE-HGF)0
|b 6
700 1 _ |a Gauquelin, Nicolas
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|b 7
700 1 _ |a Ritz, Robert
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700 1 _ |a Simson, Martin
|0 P:(DE-HGF)0
|b 9
700 1 _ |a Hille, Pascal
|0 P:(DE-HGF)0
|b 10
700 1 _ |a Schörmann, Jörg
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|b 11
700 1 _ |a Verbeeck, Johan
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909 C O |o oai:juser.fz-juelich.de:878281
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910 1 _ |a Forschungszentrum Jülich
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913 1 _ |a DE-HGF
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|v Controlling Configuration-Based Phenomena
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914 1 _ |y 2020
920 _ _ |l yes
920 1 _ |0 I:(DE-Juel1)ER-C-1-20170209
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|l Physik Nanoskaliger Systeme
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980 _ _ |a conf
980 _ _ |a VDB
980 _ _ |a I:(DE-Juel1)ER-C-1-20170209
980 _ _ |a UNRESTRICTED


LibraryCollectionCLSMajorCLSMinorLanguageAuthor
Marc 21