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Conference Presentation (Invited) FZJ-2020-02749
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From structural of functional characterisation:Measurement of atomic electric fields and polarisations by momentum-resolved STEM

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2019

5th Conference on Frontiers of Aberration Corrected Electron Microscopy PICO 2019, VaalsbroekVaalsbroek, The Netherlands, 6 May 2019 - 10 May 20192019-05-062019-05-10

Contributing Institute(s):
  1. Physik Nanoskaliger Systeme (ER-C-1)
  2. Mikrostrukturforschung (PGI-5)
Research Program(s):
  1. 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)

Appears in the scientific report 2020
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The record appears in these collections:
Document types > Presentations > Conference Presentations
Institute Collections > ER-C > ER-C-1
Institute Collections > PGI > PGI-5
Workflow collections > Public records
Publications database
 Record created 2020-08-05, last modified 2024-06-10
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