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From structural of functional characterisation:Measurement of atomic electric fields and polarisations by momentum-resolved STEM
Müller-Caspary, K.FZJ* ; Krause, F. ; Grieb, T. ; Winkler, F.FZJ* ; Duchamp, M. ; Béché, A. ; Schowalter, M. ; Migunov, V.FZJ* ; Barthel, J.FZJ* ; Soltau, H. ; Dunin-Borkowski, R.FZJ* ; Verbeeck, J. ; Van Aert, S. ; Rosenauer, A.
2019
20195th Conference on Frontiers of Aberration Corrected Electron Microscopy PICO 2019, VaalsbroekVaalsbroek, The Netherlands, 6 May 2019 - 10 May 20192019-05-062019-05-10
Contributing Institute(s):
- Physik Nanoskaliger Systeme (ER-C-1)
- Mikrostrukturforschung (PGI-5)
Research Program(s):
- 143 - Controlling Configuration-Based Phenomena (POF3-143) (POF3-143)
Appears in the scientific report
2020