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000878291 1001_ $$0P:(DE-Juel1)177024$$aStrauch, Achim$$b0$$ufzj
000878291 1112_ $$a5th Conference on Frontiers of Aberration Corrected Electron Microscopy PICO 2019$$cVaalsbroek$$d2019-05-06 - 2019-05-10$$wThe Netherlands
000878291 245__ $$aThe effect of dynamical scattering in ferroelectrics on the measurement of built-in electric fields by momentum-resolved STEM
000878291 260__ $$c2019
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000878291 536__ $$0G:(DE-HGF)POF3-143$$a143 - Controlling Configuration-Based Phenomena (POF3-143)$$cPOF3-143$$fPOF III$$x0
000878291 7001_ $$0P:(DE-HGF)0$$aRosenauer, Andreas$$b1
000878291 7001_ $$0P:(DE-Juel1)165314$$aMüller-Caspary, Knut$$b2$$ufzj
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