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@ARTICLE{Bengel:884086,
      author       = {Bengel, Christopher and Siemon, Anne and Cuppers, Felix and
                      Hoffmann-Eifert, Susanne and Hardtdegen, Alexander and von
                      Witzleben, Moritz and Hellmich, Lena and Waser, Rainer and
                      Menzel, Stephan},
      title        = {{V}ariability-{A}ware {M}odeling of {F}ilamentary
                      {O}xide-{B}ased {B}ipolar {R}esistive {S}witching {C}ells
                      {U}sing {SPICE} {L}evel {C}ompact {M}odels},
      journal      = {IEEE transactions on circuits and systems / 1 Regular
                      papers},
      volume       = {67},
      number       = {12},
      issn         = {1558-0806},
      address      = {New York, NY},
      publisher    = {Institute of Electrical and Electronics Engineers},
      reportid     = {FZJ-2020-03085},
      pages        = {4618 - 4630},
      year         = {2020},
      abstract     = {Bipolar resistive switching (BRS) cells based on the
                      valence change mechanism show great potential to enable the
                      design of future non-volatile memory, logic and neuromorphic
                      circuits and architectures. To study these circuits and
                      architectures, accurate compact models are needed, which
                      showcase the most important physical characteristics and
                      lead to their specific experimental behavior. If BRS cells
                      are to be used for computation-in-memory or for neuromorphic
                      computing, their dynamical behavior has to be modeled with
                      special consideration of switching times in SET and RESET.
                      For any realistic assessment, variability has to be
                      considered additionally. This study shows that by extending
                      an existing compact model, which by itself is able to
                      reproduce many different experiments on device behavior
                      critical for the anticipated device purposes, variability
                      found in experimental measurements can be reproduced for
                      important device characteristics such as I-V
                      characteristics, endurance behavior and most significantly
                      the SET and RESET kinetics. Furthermore, this enables the
                      study of spatial and temporal variability and its impact on
                      the circuit and system level.},
      cin          = {PGI-7 / JARA-FIT / PGI-10 / PTJ-NMT},
      ddc          = {620},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$ /
                      I:(DE-Juel1)PGI-10-20170113 / I:(DE-Juel1)PTJ-NMT-20090406},
      pnm          = {524 - Controlling Collective States (POF3-524) /
                      BMBF-16ES1134 - Verbundprojekt: Neuro-inspirierte
                      Technologien der künstlichen Intelligenz für die
                      Elektronik der Zukunft - NEUROTEC - (BMBF-16ES1134) /
                      Verbundprojekt: Neuro-inspirierte Technologien der
                      künstlichen Intelligenz für die Elektronik der Zukunft -
                      NEUROTEC -, Teilvorhaben: Forschungszentrum Jülich
                      (16ES1133K) / Advanced Computing Architectures
                      $(aca_20190115)$},
      pid          = {G:(DE-HGF)POF3-524 / G:(DE-82)BMBF-16ES1134 /
                      G:(BMBF)16ES1133K / $G:(DE-Juel1)aca_20190115$},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000596021000038},
      doi          = {10.1109/TCSI.2020.3018502},
      url          = {https://juser.fz-juelich.de/record/884086},
}