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@ARTICLE{Barnett:884796,
      author       = {Barnett, Julian and Rose, Marc‐André and Ulrich, Georg
                      and Lewin, Martin and Kästner, Bernd and Hoehl, Arne and
                      Dittmann, Regina and Gunkel, Felix and Taubner, Thomas},
      title        = {{P}honon‐{E}nhanced {N}ear‐{F}ield {S}pectroscopy to
                      {E}xtract the {L}ocal {E}lectronic {P}roperties of {B}uried
                      2{D} {E}lectron {S}ystems in {O}xide {H}eterostructures},
      journal      = {Advanced functional materials},
      volume       = {30},
      number       = {46},
      issn         = {1616-3028},
      address      = {Weinheim},
      publisher    = {Wiley-VCH},
      reportid     = {FZJ-2020-03258},
      pages        = {2004767},
      year         = {2020},
      abstract     = {In the family of functional oxide materials, the interface
                      between LaAlO3 and SrTiO3 (LAO/STO) is an interesting
                      example, as both materials are large‐bandgap insulators in
                      their bulk state but give rise to a confined 2D electron gas
                      (2DEG) when combined through thin‐film deposition. While
                      this 2DEG exhibits remarkable properties, its experimental
                      investigation is mostly limited to destructive or
                      non‐local (i.e. averaging over larger areas) methods until
                      recently. Scanning near‐field optical microscopy is shown
                      to overcome this limitation, detecting buried 2DEGs by using
                      highly confined optical near‐fields. Here, a full
                      spectroscopic approach with phonon‐enhancement and
                      simulations based on the finite dipole model is combined to
                      extract quantitative electronic properties of the
                      interfacial LAO/STO 2DEG. This threefold improvement
                      compared to previous work will enable the quantitative
                      nanoscale, non‐destructive, sub‐surface analysis of
                      complex oxide thin films and interfaces, as well as similar
                      heterostructures.},
      cin          = {PGI-7 / JARA-FIT},
      ddc          = {530},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {524 - Controlling Collective States (POF3-524)},
      pid          = {G:(DE-HGF)POF3-524},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000567443000001},
      doi          = {10.1002/adfm.202004767},
      url          = {https://juser.fz-juelich.de/record/884796},
}