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@ARTICLE{Wilson:884824,
author = {Wilson, Daniel Julian Arthur and Schmitz, Christoph and
Rudolf, Denis and Wiemann, Carsten and Schneider, Claus M
and Juschkin, Larissa},
title = {{O}n space charge effects in laboratory-based photoemission
electron microscopy using compact gas discharge extreme
ultraviolet sources},
journal = {New journal of physics},
volume = {22},
issn = {1367-2630},
address = {[London]},
publisher = {IOP},
reportid = {FZJ-2020-03279},
pages = {103019},
year = {2020},
abstract = {The analysis of electronic and structural properties of
surfaces has been greatly advanced by photoemission electron
microscopy and spectroscopy techniques. To further improve
lateral and energy resolution of the instruments, it is
necessary to optimize parameters of the radiation sources
employed for photoemission studies (e.g. photon flux, pulse
duration, spot size etc.). We studied space charge effects
observed in an energy-filtering photoemission electron
microscope operated with a compact laboratory-scale
gas-discharge extreme ultraviolet light source. In this
system, we found limits of spatial- and energy-resolution
controlled by the source radiation parameters. The pulse
repetition rate can be varied in the kHz range and the
duration of the EUV emission was measured to be several tens
of nanoseconds long, and thereby very different from the
standard synchrotron sources typically used for similar
experiments. The spatial resolution could be improved by a
factor of 5, but only on the expense of the photon density
per pulse, which had to be decreased by a factor of 17 in
order to reduce the image blur due to space charge effects.
Furthermore, we found broadening of the X-ray photoelectron
spectroscopy peaks for high photon fluxes. We have also
performed a n-body Monte Carlo simulation to evaluate the
difference between core-level photoelectrons and secondary
electrons with respect to space charge.},
cin = {PGI-9 / PGI-6 / JARA-FIT},
ddc = {530},
cid = {I:(DE-Juel1)PGI-9-20110106 / I:(DE-Juel1)PGI-6-20110106 /
$I:(DE-82)080009_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521)},
pid = {G:(DE-HGF)POF3-521},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000578365400001},
doi = {10.1088/1367-2630/abbc29},
url = {https://juser.fz-juelich.de/record/884824},
}