TY  - CHAP
AU  - Lopes, J.M.J.
AU  - Durgun Özben, E.
AU  - Schnee, M.
AU  - Luptak, R.
AU  - Nichau, A.
AU  - Tiedemann, A.
AU  - Yu, W.
AU  - Zhao, Q.T.
AU  - Besmehn, A.
AU  - Breuer, U.
AU  - Luysberg, M.
AU  - Lenk, St.
AU  - Schubert, J.
AU  - Mantl, S.
TI  - Electrical and structural properties of ternary rare-earth oxides on Si and higher mobility substrates and their integration as high-k gate dielectrics in MOSFET devices
VL  - 35
SN  - 1938-5862
CY  - Pennington, NJ
PB  - Electrochemical Society (ECS)
M1  - FZJ-2020-03652
T2  - ECS transactions
SP  - 461 - 479
PY  - 2011
N1  - Record converted from VDB: 12.11.2012
LB  - PUB:(DE-HGF)7
UR  - https://juser.fz-juelich.de/record/885248
ER  -