%0 Book Section
%A Sedghi, N.
%A Mitrovic, I.Z.
%A Lopes, J.M.J.
%A Schubert, J.
%A Hall, S.
%T Investigation of Electron and Hole Charge Trapping in LaLuO3 Stack MOS Capacitor Using the Three-Pulse CV Technique
%V 35
%@ 1938-5862
%C Pennington, NJ
%I Electrochemical Society (ECS)
%M FZJ-2020-03653
%B ECS transactions
%P 531 - 543
%D 2011
%Z Record converted from VDB: 12.11.2012
%F PUB:(DE-HGF)7
%9 Contribution to a book
%U https://juser.fz-juelich.de/record/885249