TY  - CHAP
AU  - Sedghi, N.
AU  - Mitrovic, I.Z.
AU  - Lopes, J.M.J.
AU  - Schubert, J.
AU  - Hall, S.
TI  - Investigation of Electron and Hole Charge Trapping in LaLuO3 Stack MOS Capacitor Using the Three-Pulse CV Technique
VL  - 35
SN  - 1938-5862
CY  - Pennington, NJ
PB  - Electrochemical Society (ECS)
M1  - FZJ-2020-03653
T2  - ECS transactions
SP  - 531 - 543
PY  - 2011
N1  - Record converted from VDB: 12.11.2012
LB  - PUB:(DE-HGF)7
UR  - https://juser.fz-juelich.de/record/885249
ER  -