%0 Book Section
%A Ducroquet, F.
%A Engström, O.
%A Gottlob, H.D.B.
%A Lopes, J.M.J.
%A Schubert, J.
%T Admittance Spectroscopy of Si/LaLuO3 and Si/GdSiO MOS Structures
%V 45
%@ 1938-5862
%C Pennington, NJ
%I Electrochemical Society (ECS)
%M FZJ-2020-03658
%B ECS transactions
%P 103 - 117
%D 2012
%Z Record converted from VDB: 12.11.2012
%F PUB:(DE-HGF)7
%9 Contribution to a book
%U <Go to ISI:>//WOS:000325405800012
%R 10.1149/1.3700877
%U https://juser.fz-juelich.de/record/885254