TY  - CHAP
AU  - Ducroquet, F.
AU  - Engström, O.
AU  - Gottlob, H.D.B.
AU  - Lopes, J.M.J.
AU  - Schubert, J.
TI  - Admittance Spectroscopy of Si/LaLuO3 and Si/GdSiO MOS Structures
VL  - 45
SN  - 1938-5862
CY  - Pennington, NJ
PB  - Electrochemical Society (ECS)
M1  - FZJ-2020-03658
T2  - ECS transactions
SP  - 103 - 117
PY  - 2012
N1  - Record converted from VDB: 12.11.2012
LB  - PUB:(DE-HGF)7
UR  - <Go to ISI:>//WOS:000325405800012
DO  - DOI:10.1149/1.3700877
UR  - https://juser.fz-juelich.de/record/885254
ER  -