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| Hauptseite > Publikationsdatenbank > Admittance Spectroscopy of Si/LaLuO3 and Si/GdSiO MOS Structures > print |
| Hauptseite > Publikationsdatenbank > Admittance Spectroscopy of Si/LaLuO3 and Si/GdSiO MOS Structures > print |
| 001 | 885254 | ||
| 005 | 20201003142516.0 | ||
| 024 | 7 | _ | |a 10.1149/1.3700877 |2 DOI |
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| 100 | 1 | _ | |a Ducroquet, F. |0 P:(DE-HGF)0 |b 0 |
| 245 | _ | _ | |a Admittance Spectroscopy of Si/LaLuO3 and Si/GdSiO MOS Structures |
| 260 | _ | _ | |a Pennington, NJ |c 2012 |b Electrochemical Society (ECS) |
| 300 | _ | _ | |a 103 - 117 |
| 336 | 7 | _ | |a BOOK_CHAPTER |2 ORCID |
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