000885497 001__ 885497
000885497 005__ 20210130010422.0
000885497 0247_ $$2doi$$a10.1063/1.5143659
000885497 0247_ $$2Handle$$a2128/25852
000885497 0247_ $$2altmetric$$aaltmetric:74206642
000885497 0247_ $$2WOS$$aWOS:000519597500001
000885497 037__ $$aFZJ-2020-03878
000885497 082__ $$a600
000885497 1001_ $$00000-0001-5717-2549$$aBurr, Geoffrey W.$$b0$$eCorresponding author
000885497 245__ $$aEmerging materials in neuromorphic computing: Guest editorial
000885497 260__ $$aMelville, NY$$bAIP Publ.$$c2020
000885497 3367_ $$2DRIVER$$aarticle
000885497 3367_ $$2DataCite$$aOutput Types/Journal article
000885497 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1602081083_7887
000885497 3367_ $$2BibTeX$$aARTICLE
000885497 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000885497 3367_ $$00$$2EndNote$$aJournal Article
000885497 536__ $$0G:(DE-HGF)POF3-521$$a521 - Controlling Electron Charge-Based Phenomena (POF3-521)$$cPOF3-521$$fPOF III$$x0
000885497 588__ $$aDataset connected to CrossRef
000885497 7001_ $$00000-0001-5603-5243$$aSebastian, Abu$$b1
000885497 7001_ $$00000-0002-8868-9951$$aVianello, Elisa$$b2
000885497 7001_ $$00000-0002-5426-9967$$aWaser, Rainer$$b3
000885497 7001_ $$00000-0003-4702-6139$$aParkin, Stuart$$b4
000885497 773__ $$0PERI:(DE-600)2722985-3$$a10.1063/1.5143659$$gVol. 8, no. 1, p. 010401 -$$n1$$p010401 -$$tAPL materials$$v8$$x2166-532X$$y2020
000885497 8564_ $$uhttps://juser.fz-juelich.de/record/885497/files/1.5143659.pdf$$yOpenAccess
000885497 8564_ $$uhttps://juser.fz-juelich.de/record/885497/files/1.5143659.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000885497 909CO $$ooai:juser.fz-juelich.de:885497$$pdnbdelivery$$pdriver$$pVDB$$popen_access$$popenaire
000885497 9101_ $$0I:(DE-588b)5008462-8$$60000-0002-5426-9967$$aForschungszentrum Jülich$$b3$$kFZJ
000885497 9131_ $$0G:(DE-HGF)POF3-521$$1G:(DE-HGF)POF3-520$$2G:(DE-HGF)POF3-500$$3G:(DE-HGF)POF3$$4G:(DE-HGF)POF$$aDE-HGF$$bKey Technologies$$lFuture Information Technology - Fundamentals, Novel Concepts and Energy Efficiency (FIT)$$vControlling Electron Charge-Based Phenomena$$x0
000885497 9141_ $$y2020
000885497 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2020-01-16
000885497 915__ $$0LIC:(DE-HGF)CCBYNV$$2V:(DE-HGF)$$aCreative Commons Attribution CC BY (No Version)$$bDOAJ$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bAPL MATER : 2018$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0501$$2StatID$$aDBCoverage$$bDOAJ Seal$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0500$$2StatID$$aDBCoverage$$bDOAJ$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0111$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0700$$2StatID$$aFees$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000885497 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bDOAJ : Peer review$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0561$$2StatID$$aArticle Processing Charges$$f2020-01-16
000885497 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2020-01-16
000885497 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2020-01-16
000885497 9201_ $$0I:(DE-Juel1)PGI-7-20110106$$kPGI-7$$lElektronische Materialien$$x0
000885497 9201_ $$0I:(DE-82)080009_20140620$$kJARA-FIT$$lJARA-FIT$$x1
000885497 980__ $$ajournal
000885497 980__ $$aVDB
000885497 980__ $$aUNRESTRICTED
000885497 980__ $$aI:(DE-Juel1)PGI-7-20110106
000885497 980__ $$aI:(DE-82)080009_20140620
000885497 9801_ $$aFullTexts