TY  - JOUR
AU  - Paul, N.
AU  - Frielinghaus, H.
AU  - Busch, Sebastian
AU  - Pipich, V.
AU  - Gilles, R.
TI  - Combining SANS and VSANS to Extend Q-Range for Morphology Investigation of Silicon-Graphite Anodes
JO  - Surface investigation, x-ray, synchrotron and neutron techniques
VL  - 14
IS  - S1
SN  - 0734-1520
CY  - New York, NY
PB  - Gordon and Breach
M1  - FZJ-2020-03937
SP  - S156 - S160
PY  - 2020
AB  - Silicon-based electrodes are attractive candidates as anodes for Li-ion batteries due to their high theoretical specific capacity. However, repeated lithiation/delithiation causes significant  morphological changes of the silicon particles which results in formation of highly porous silicon structures and severe side reactions at the silicon/electrolyte interface. To quantify such morphological changes in the micrometer as well as on the nanometer scale, we combine very small-angle neutron scattering (VSANS) and small-angle neutron scattering (SANS) techniques. While conventional and contrast-matched SANS data provide insights into the solid-electrolyte-interphase (SEI) coverage around the silicon particles and filling of the evolving porosity within the electrode, VSANS data provide information on the micrometer-sized graphite particles.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000578828100032
DO  - DOI:10.1134/S1027451020070368
UR  - https://juser.fz-juelich.de/record/885573
ER  -