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| 001 | 885573 | ||
| 005 | 20210130010436.0 | ||
| 024 | 7 | _ | |a 10.1134/S1027451020070368 |2 doi |
| 024 | 7 | _ | |a 1027-4510 |2 ISSN |
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| 024 | 7 | _ | |a 2128/25946 |2 Handle |
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| 037 | _ | _ | |a FZJ-2020-03937 |
| 041 | _ | _ | |a English |
| 082 | _ | _ | |a 530 |
| 100 | 1 | _ | |a Paul, N. |0 P:(DE-Juel1)131279 |b 0 |e Corresponding author |
| 245 | _ | _ | |a Combining SANS and VSANS to Extend Q-Range for Morphology Investigation of Silicon-Graphite Anodes |
| 260 | _ | _ | |a New York, NY |c 2020 |b Gordon and Breach |
| 336 | 7 | _ | |a article |2 DRIVER |
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| 520 | _ | _ | |a Silicon-based electrodes are attractive candidates as anodes for Li-ion batteries due to their high theoretical specific capacity. However, repeated lithiation/delithiation causes significant morphological changes of the silicon particles which results in formation of highly porous silicon structures and severe side reactions at the silicon/electrolyte interface. To quantify such morphological changes in the micrometer as well as on the nanometer scale, we combine very small-angle neutron scattering (VSANS) and small-angle neutron scattering (SANS) techniques. While conventional and contrast-matched SANS data provide insights into the solid-electrolyte-interphase (SEI) coverage around the silicon particles and filling of the evolving porosity within the electrode, VSANS data provide information on the micrometer-sized graphite particles. |
| 536 | _ | _ | |a 6G4 - Jülich Centre for Neutron Research (JCNS) (POF3-623) |0 G:(DE-HGF)POF3-6G4 |c POF3-623 |f POF III |x 0 |
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| 693 | _ | _ | |a Forschungs-Neutronenquelle Heinz Maier-Leibnitz |e KWS-3: Very small angle scattering diffractometer with focusing mirror |f NL3auS |1 EXP:(DE-MLZ)FRMII-20140101 |0 EXP:(DE-MLZ)KWS3-20140101 |5 EXP:(DE-MLZ)KWS3-20140101 |6 EXP:(DE-MLZ)NL3auS-20140101 |x 0 |
| 693 | _ | _ | |a Forschungs-Neutronenquelle Heinz Maier-Leibnitz |e SANS-1: Small angle neutron scattering |f NL4a |1 EXP:(DE-MLZ)FRMII-20140101 |0 EXP:(DE-MLZ)SANS-1-20140101 |5 EXP:(DE-MLZ)SANS-1-20140101 |6 EXP:(DE-MLZ)NL4a-20140101 |x 1 |
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| 700 | 1 | _ | |a Busch, Sebastian |0 P:(DE-Juel1)128524 |b 2 |
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| 700 | 1 | _ | |a Gilles, R. |0 P:(DE-HGF)0 |b 4 |
| 773 | _ | _ | |a 10.1134/S1027451020070368 |g Vol. 14, no. S1, p. S156 - S160 |0 PERI:(DE-600)1356494-8 |n S1 |p S156 - S160 |t Surface investigation, x-ray, synchrotron and neutron techniques |v 14 |y 2020 |x 0734-1520 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/885573/files/Neelima.pdf |y OpenAccess |
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