% IMPORTANT: The following is UTF-8 encoded. This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.
@ARTICLE{Vayyala:887782,
author = {Vayyala, Ashok and Povstugar, Ivan and Naumenko, Dmitry and
Quadakkers, Willem J. and Hattendorf, Heike and Mayer,
Joachim},
title = {{A} {N}anoscale {S}tudy of {T}hermally {G}rown {C}hromia on
{H}igh-{C}r {F}erritic {S}teels and {A}ssociated {O}xidation
{M}echanisms},
journal = {Journal of the Electrochemical Society},
volume = {167},
number = {6},
issn = {0013-4651},
address = {Bristol},
publisher = {IOP Publishing},
reportid = {FZJ-2020-04419},
pages = {061502},
year = {2020},
abstract = {Fe-22Cr-0.5Mn based ferritic steels are used as
interconnect materials for solid oxide fuel/electrolysis
cells. Four steel samples, including the commercial steel
Crofer 22 H, were oxidized at 800 °C in a model
$Ar-4\%H2-4\%H2O$ atmosphere simulating the fuel side of the
cells and investigated by atom probe tomography (APT) in
conjunction with electron microscopy and thermogravimetry.
All steels form an oxide scale mainly consisting of MnCr2O4
spinel on top of Cr2O3. APT revealed segregation of minor
alloying constituents (Nb and Ti) to chromia grain
boundaries and highlighted their effect on mass transport
through the chromia scale. Relationships between segregation
activity of individual elements (in terms of Gibbsian
interfacial excess), oxide scale microstructure and alloy
oxidation rate have been established based on the APT
results. Comparison of segregation activities revealed that
vacancies formation due to Wagner-Hauffe doping with
aliovalent Ti and Nb impurities cannot be solely responsible
for faster oxidation, assuming alteration of the grain
boundary structure and associated changes of their mass
transport properties. Controlled Si addition to the alloy
(about 0.4 $at\%)$ suppresses the detrimental effect of Nb
on the oxidation resistance but results in formation of a
thin, although still discontinuous, SiO2 layer at the
metal-oxide interface. © 2020 The Author(s). Published on
behalf of The Electrochemical Society by IOP Publishing
Limited.},
cin = {ZEA-3 / IEK-2 / ER-C-2},
ddc = {660},
cid = {I:(DE-Juel1)ZEA-3-20090406 / I:(DE-Juel1)IEK-2-20101013 /
I:(DE-Juel1)ER-C-2-20170209},
pnm = {113 - Methods and Concepts for Material Development
(POF3-113) / HITEC - Helmholtz Interdisciplinary Doctoral
Training in Energy and Climate Research (HITEC)
(HITEC-20170406)},
pid = {G:(DE-HGF)POF3-113 / G:(DE-Juel1)HITEC-20170406},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000521492700001},
doi = {10.1149/1945-7111/ab7d2e},
url = {https://juser.fz-juelich.de/record/887782},
}