Hauptseite > Publikationsdatenbank > Near-field Electron Ptychography using a Silicon Nitride diffuser > print

001     888495
005     20210127115509.0
024 7 _ |a 2128/26702
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037 _ _ |a FZJ-2020-04959
041 _ _ |a English
100 1 _ |a Allars, F.
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111 2 _ |a European Microscopy Congress
|c Oxford
|d 2020-11-24 - 2020-11-26
|w UK
245 _ _ |a Near-field Electron Ptychography using a Silicon Nitride diffuser
260 _ _ |c 2020
336 7 _ |a Conference Paper
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336 7 _ |a Other
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536 _ _ |a 143 - Controlling Configuration-Based Phenomena (POF3-143)
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536 _ _ |a ESTEEM3 - Enabling Science and Technology through European Electron Microscopy (823717)
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700 1 _ |a Lu, Penghan
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700 1 _ |a Kruth, Maximilian
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700 1 _ |a Dunin-Borkowski, Rafal
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700 1 _ |a Rodenburg, J.
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700 1 _ |a Maiden, A.
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856 4 _ |u https://juser.fz-juelich.de/record/888495/files/Near%20field%20electron.pdf
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