%0 Journal Article
%A Hassani, Hossein
%A Wolf, Nikolaus Radja
%A Yuan, Xiaobo
%A Wördenweber, Roger
%A Offenhäusser, Andreas
%T Platinum substrate for surface plasmon microscopy at small angles
%J Optics letters
%V 45
%N 12
%@ 1539-4794
%C Washington, DC
%I Soc.
%M FZJ-2020-05257
%P 3292 -
%D 2020
%X Platinum is reported as the main component of the substrate in surface plasmon microscopy of the metal−dielectric interface for small-angle measurements. In the absence of a narrow dip in the angular spectrum of platinum, the refractive index of the dielectric medium or the thickness of a deposited layer is proven deducible from the observed sharp peak, close to the critical angle. The sensitivities of refractive index and thickness measurements using platinum are compared with that of a gold surface plasmon resonance chip. Furthermore, the thickness of a structured layer of (3-Aminopropyl)triethoxysilane on the platinum substrate is measured to be 0.7 nm, demonstrating the high sensitivity of the technique.
%F PUB:(DE-HGF)16
%9 Journal Article
%$ 32538965
%U <Go to ISI:>//WOS:000541729300029
%R 10.1364/OL.396051
%U https://juser.fz-juelich.de/record/888843