TY  - JOUR
AU  - Hassani, Hossein
AU  - Wolf, Nikolaus Radja
AU  - Yuan, Xiaobo
AU  - Wördenweber, Roger
AU  - Offenhäusser, Andreas
TI  - Platinum substrate for surface plasmon microscopy at small angles
JO  - Optics letters
VL  - 45
IS  - 12
SN  - 1539-4794
CY  - Washington, DC
PB  - Soc.
M1  - FZJ-2020-05257
SP  - 3292 -
PY  - 2020
AB  - Platinum is reported as the main component of the substrate in surface plasmon microscopy of the metal−dielectric interface for small-angle measurements. In the absence of a narrow dip in the angular spectrum of platinum, the refractive index of the dielectric medium or the thickness of a deposited layer is proven deducible from the observed sharp peak, close to the critical angle. The sensitivities of refractive index and thickness measurements using platinum are compared with that of a gold surface plasmon resonance chip. Furthermore, the thickness of a structured layer of (3-Aminopropyl)triethoxysilane on the platinum substrate is measured to be 0.7 nm, demonstrating the high sensitivity of the technique.
LB  - PUB:(DE-HGF)16
C6  - 32538965
UR  - <Go to ISI:>//WOS:000541729300029
DO  - DOI:10.1364/OL.396051
UR  - https://juser.fz-juelich.de/record/888843
ER  -