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100 1 _ |a Hassani, Hossein
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245 _ _ |a Platinum substrate for surface plasmon microscopy at small angles
260 _ _ |a Washington, DC
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520 _ _ |a Platinum is reported as the main component of the substrate in surface plasmon microscopy of the metal−dielectric interface for small-angle measurements. In the absence of a narrow dip in the angular spectrum of platinum, the refractive index of the dielectric medium or the thickness of a deposited layer is proven deducible from the observed sharp peak, close to the critical angle. The sensitivities of refractive index and thickness measurements using platinum are compared with that of a gold surface plasmon resonance chip. Furthermore, the thickness of a structured layer of (3-Aminopropyl)triethoxysilane on the platinum substrate is measured to be 0.7 nm, demonstrating the high sensitivity of the technique.
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700 1 _ |a Wolf, Nikolaus Radja
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700 1 _ |a Yuan, Xiaobo
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700 1 _ |a Wördenweber, Roger
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700 1 _ |a Offenhäusser, Andreas
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