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@ARTICLE{Yang:889367,
author = {Yang, Lin and Wysocki, Lena and Schöpf, Jörg and Jin, Lei
and Kovács, András and Gunkel, Felix and Dittmann, Regina
and van Loosdrecht, Paul H. M. and Lindfors-Vrejoiu, Ionela},
title = {{O}rigin of the hump anomalies in the {H}all resistance
loops of ultrathin {S}r{R}u{O} 3 / {S}r{I}r{O} 3
multilayers},
journal = {Physical review materials},
volume = {5},
number = {1},
issn = {2475-9953},
address = {College Park, MD},
publisher = {APS},
reportid = {FZJ-2021-00256},
pages = {014403},
year = {2021},
abstract = {The proposal that very small Néel skyrmions can form in
SrRuO3/SrIrO3 epitaxial bilayers and that the electric field
effect can be used to manipulate these skyrmions in gated
devices strongly stimulated the recent research of SrRuO3
heterostructures. A strong interfacial Dzyaloshinskii-Moriya
interaction was considered as the driving force for the
formation of skyrmions in SrRuO3/SrIrO3 bilayers. Here, we
investigated nominally symmetric heterostructures in which
an ultrathin ferromagnetic SrRuO3 layer is sandwiched
between large spin-orbit coupling SrIrO3 layers, for which
the conditions are not favorable for the emergence of a net
interfacial Dzyaloshinskii-Moriya interaction. Previously
the formation of skyrmions in the asymmetric SrRuO3/SrIrO3
bilayers was inferred from anomalous Hall resistance loops
showing humplike features that resembled topological Hall
effect contributions. Symmetric SrIrO3/SrRuO3/SrIrO3
trilayers do not show hump anomalies in the Hall loops.
However, the anomalous Hall resistance loops of symmetric
multilayers, in which the trilayer is stacked several times,
do exhibit the humplike structures, similar to the
asymmetric SrRuO3/SrIrO3 bilayers. The origin of the Hall
effect loop anomalies likely resides in unavoidable
differences in the electronic and magnetic properties of the
individual SrRuO3 layers rather than in the formation of
skyrmions.},
cin = {ER-C-1},
ddc = {530},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {5353 - Understanding the Structural and Functional Behavior
of Solid State Systems (POF4-535)},
pid = {G:(DE-HGF)POF4-5353},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000607538000003},
doi = {10.1103/PhysRevMaterials.5.014403},
url = {https://juser.fz-juelich.de/record/889367},
}