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@INPROCEEDINGS{Dittmann:890068,
      author       = {Dittmann, Regina and Hensling, Felix and Heisig, Thomas and
                      Xu, Chengcheng and Gunkel, Felix},
      title        = {{E}ngineering defect formation in functional oxide thin
                      films and heterostructures},
      reportid     = {FZJ-2021-00658},
      year         = {2020},
      month         = {Jan},
      date          = {2020-01-22},
      organization  = {EMA 2020, Orlando (USA), 22 Jan 2020 -
                       24 Jan 2020},
      subtyp        = {Invited},
      cin          = {PGI-7 / JARA-FIT},
      cid          = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$},
      pnm          = {521 - Controlling Electron Charge-Based Phenomena
                      (POF3-521) / Advanced Computing Architectures
                      $(aca_20190115)$},
      pid          = {G:(DE-HGF)POF3-521 / $G:(DE-Juel1)aca_20190115$},
      typ          = {PUB:(DE-HGF)6},
      url          = {https://juser.fz-juelich.de/record/890068},
}