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@ARTICLE{Abbaspour:890070,
author = {Abbaspour, E. and Menzel, Stephan and Jungemann, C.},
title = {{S}tudying the switching variability in redox-based
resistive switching devices},
journal = {Journal of computational electronics},
volume = {19},
number = {4},
issn = {1572-8137},
address = {Dordrecht},
publisher = {Springer Science + Business Media B.V.},
reportid = {FZJ-2021-00660},
pages = {1426 - 1432},
year = {2020},
abstract = {The variability of switching parameters in redox-based
resistive switching RAM (ReRAM) devices is investigated by a
3D kinetic Monte Carlo approach. This physics-based model
can simulate the filamentary resistive switching in the
electroforming, SET and RESET processes and captures their
key features. It allows to predict the impact of the forming
and switching conditions on the fluctuations of key
parameters like the current and resistance levels of the
cell in on and off states. The origin of the variability of
the switching parameters was investigated in terms of the
involved physical processes. The simulations also confirm
the multilevel cell operation capabilities of ReRAM
devices.},
cin = {PGI-7 / JARA-FIT},
ddc = {004},
cid = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$},
pnm = {521 - Controlling Electron Charge-Based Phenomena
(POF3-521) / 5233 - Memristive Materials and Devices
(POF4-523)},
pid = {G:(DE-HGF)POF3-521 / G:(DE-HGF)POF4-5233},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000543042300002},
doi = {10.1007/s10825-020-01537-y},
url = {https://juser.fz-juelich.de/record/890070},
}