%0 Journal Article
%A Allars, Frederick
%A Lu, Peng-Han
%A Kruth, Maximilian
%A Dunin-Borkowski, Rafal E.
%A Rodenburg, John M.
%A Maiden, Andrew M.
%T Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser
%J Ultramicroscopy
%V 11
%@ 0304-3991
%C Amsterdam
%I Elsevier Science
%M FZJ-2021-01382
%P 113257 -
%D 2021
%X Most implementations of ptychography on the electron microscope operate in scanning transmission (STEM) mode, where a small focussed probe beam is rapidly scanned across the sample. In this paper we introduce a different approach based on near-field ptychography, where the focussed beam is replaced by a wide-field, structured illumination, realised through a purpose-designed etched Silicon Nitride window. We show that fields of view as large as 100μm [2] can be imaged using the new approach, and that quantitative electron phase images can be reconstructed from as few as nine near-field diffraction pattern measurements.
%F PUB:(DE-HGF)16
%9 Journal Article
%$ pmid:33773842
%U <Go to ISI:>//WOS:000744190300005
%R 10.1016/j.ultramic.2021.113257
%U https://juser.fz-juelich.de/record/891130