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000891130 1001_ $$0P:(DE-HGF)0$$aAllars, Frederick$$b0
000891130 245__ $$aEfficient large field of view electron phase imaging using near-field electron ptychography with a diffuser
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000891130 520__ $$aMost implementations of ptychography on the electron microscope operate in scanning transmission (STEM) mode, where a small focussed probe beam is rapidly scanned across the sample. In this paper we introduce a different approach based on near-field ptychography, where the focussed beam is replaced by a wide-field, structured illumination, realised through a purpose-designed etched Silicon Nitride window. We show that fields of view as large as 100μm [2] can be imaged using the new approach, and that quantitative electron phase images can be reconstructed from as few as nine near-field diffraction pattern measurements.
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000891130 7001_ $$0P:(DE-Juel1)144121$$aDunin-Borkowski, Rafal E.$$b3$$ufzj
000891130 7001_ $$0P:(DE-HGF)0$$aRodenburg, John M.$$b4
000891130 7001_ $$0P:(DE-HGF)0$$aMaiden, Andrew M.$$b5$$eCorresponding author
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