TY  - JOUR
AU  - Allars, Frederick
AU  - Lu, Peng-Han
AU  - Kruth, Maximilian
AU  - Dunin-Borkowski, Rafal E.
AU  - Rodenburg, John M.
AU  - Maiden, Andrew M.
TI  - Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser
JO  - Ultramicroscopy
VL  - 11
SN  - 0304-3991
CY  - Amsterdam
PB  - Elsevier Science
M1  - FZJ-2021-01382
SP  - 113257 -
PY  - 2021
AB  - Most implementations of ptychography on the electron microscope operate in scanning transmission (STEM) mode, where a small focussed probe beam is rapidly scanned across the sample. In this paper we introduce a different approach based on near-field ptychography, where the focussed beam is replaced by a wide-field, structured illumination, realised through a purpose-designed etched Silicon Nitride window. We show that fields of view as large as 100μm [2] can be imaged using the new approach, and that quantitative electron phase images can be reconstructed from as few as nine near-field diffraction pattern measurements.
LB  - PUB:(DE-HGF)16
C6  - pmid:33773842
UR  - <Go to ISI:>//WOS:000744190300005
DO  - DOI:10.1016/j.ultramic.2021.113257
UR  - https://juser.fz-juelich.de/record/891130
ER  -