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@ARTICLE{Allars:891130,
author = {Allars, Frederick and Lu, Peng-Han and Kruth, Maximilian
and Dunin-Borkowski, Rafal E. and Rodenburg, John M. and
Maiden, Andrew M.},
title = {{E}fficient large field of view electron phase imaging
using near-field electron ptychography with a diffuser},
journal = {Ultramicroscopy},
volume = {11},
issn = {0304-3991},
address = {Amsterdam},
publisher = {Elsevier Science},
reportid = {FZJ-2021-01382},
pages = {113257 -},
year = {2021},
abstract = {Most implementations of ptychography on the electron
microscope operate in scanning transmission (STEM) mode,
where a small focussed probe beam is rapidly scanned across
the sample. In this paper we introduce a different approach
based on near-field ptychography, where the focussed beam is
replaced by a wide-field, structured illumination, realised
through a purpose-designed etched Silicon Nitride window. We
show that fields of view as large as 100μm [2] can be
imaged using the new approach, and that quantitative
electron phase images can be reconstructed from as few as
nine near-field diffraction pattern measurements.},
cin = {ER-C-1},
ddc = {570},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {535 - Materials Information Discovery (POF4-535) / ESTEEM3
- Enabling Science and Technology through European Electron
Microscopy (823717) / Q-SORT - QUANTUM SORTER (766970)},
pid = {G:(DE-HGF)POF4-535 / G:(EU-Grant)823717 /
G:(EU-Grant)766970},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:33773842},
UT = {WOS:000744190300005},
doi = {10.1016/j.ultramic.2021.113257},
url = {https://juser.fz-juelich.de/record/891130},
}