Home > Publications database > Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser > print

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005     20220930130310.0
024 7 _ |a 10.1016/j.ultramic.2021.113257
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100 1 _ |a Allars, Frederick
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245 _ _ |a Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser
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520 _ _ |a Most implementations of ptychography on the electron microscope operate in scanning transmission (STEM) mode, where a small focussed probe beam is rapidly scanned across the sample. In this paper we introduce a different approach based on near-field ptychography, where the focussed beam is replaced by a wide-field, structured illumination, realised through a purpose-designed etched Silicon Nitride window. We show that fields of view as large as 100μm [2] can be imaged using the new approach, and that quantitative electron phase images can be reconstructed from as few as nine near-field diffraction pattern measurements.
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700 1 _ |a Kruth, Maximilian
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700 1 _ |a Dunin-Borkowski, Rafal E.
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700 1 _ |a Rodenburg, John M.
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700 1 _ |a Maiden, Andrew M.
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773 _ _ |a 10.1016/j.ultramic.2021.113257
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856 4 _ |u https://juser.fz-juelich.de/record/891130/files/Invoice_OAD0000108085.pdf
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