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| 001 | 891432 | ||
| 005 | 20240711114034.0 | ||
| 024 | 7 | _ | |a 10.1016/j.nme.2019.03.018 |2 doi |
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| 037 | _ | _ | |a FZJ-2021-01517 |
| 082 | _ | _ | |a 624 |
| 100 | 1 | _ | |a Eichler, Michael |0 P:(DE-Juel1)166210 |b 0 |e Corresponding author |
| 245 | _ | _ | |a Investigation of hydrogen isotope retention mechanisms in beryllium: High resolution TPD measurements |
| 260 | _ | _ | |a Amsterdam [u.a.] |c 2019 |b Elsevier |
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| 520 | _ | _ | |a The retention of ion-implanted deuterium in beryllium poly- and single crystals at room temperature is studied using high precision temperature programmed desorption spectroscopy (TPD). Slow temperature ramps of 0.01 K/s in combination with well-defined experimental conditions are used to resolve the low temperature desorption regime for the first time revealing three sharp desorption peaks. The comparison to results of a coupled reaction diffusion system (CRDS) model shows, that the corresponding release mechanisms cannot be described by thermally activated rate processes. SEM images of a polycrystalline beryllium sample after implantation of deuterium with 2 keV per D atom show the formation of blisters of roughly 1 µm in diameter. Additionally, cracks on top of the blisters are found as well as spots, on which blisters are peeled off. Both processes are discussed to play a role in the low temperature release regime of the retained deuterium. Investigation of TPD spectra performed on single crystalline beryllium shows a jagged pattern in the low temperature release regime, which can be connected to blisters bursting up, releasing big amounts of deuterium in short time scales. |
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| 773 | _ | _ | |a 10.1016/j.nme.2019.03.018 |g Vol. 19, p. 440 - 444 |0 PERI:(DE-600)2808888-8 |p 440 - 444 |t Nuclear materials and energy |v 19 |y 2019 |x 2352-1791 |
| 856 | 4 | _ | |u https://juser.fz-juelich.de/record/891432/files/1-s2.0-S2352179118302771-main.pdf |y OpenAccess |
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