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@ARTICLE{Stadlmayr:891760,
      author       = {Stadlmayr, Reinhard and Szabo, Paul Stefan and Biber,
                      Herbert and Koslowski, Hans Rudolf and Kadletz, Elisabeth
                      and Cupak, Christian and Wilhelm, Richard Arthur and Schmid,
                      Michael and Linsmeier, Christian and Aumayr, Friedrich},
      title        = {{A} high temperature dual-mode quartz crystal microbalance
                      technique for erosion and thermal desorption spectroscopy
                      measurements},
      journal      = {Review of scientific instruments},
      volume       = {91},
      number       = {12},
      issn         = {1089-7623},
      address      = {[S.l.]},
      publisher    = {American Institute of Physics},
      reportid     = {FZJ-2021-01720},
      pages        = {125104 -},
      year         = {2020},
      abstract     = {An improved quartz crystal microbalance measurement method
                      is described, which allows us to determine erosion,
                      implantation, and release rates of thin films, during
                      changing temperatures and up to 700 K. A quasi-simultaneous
                      excitation of two eigenmodes of the quartz resonator is able
                      to compensate for frequency drifts due to temperature
                      changes. The necessary electronics, the controlling
                      behavior, and the dual-mode temperature compensation are
                      described. With this improved technique, quantitative in
                      situ temperature-programmed desorption measurements are
                      possible and the quartz crystal microbalance can be used for
                      quantification of thermal desorption spectroscopy
                      measurements with a quadrupole mass spectrometer. This is
                      demonstrated by a study of the retention and release
                      behavior of hydrogen isotopes in fusion-relevant materials.
                      We find that more than $90\%$ of the deuterium implanted
                      into a thin film of beryllium is released during a
                      subsequent temperature ramp up to 500 K},
      cin          = {IEK-4},
      ddc          = {620},
      cid          = {I:(DE-Juel1)IEK-4-20101013},
      pnm          = {174 - Plasma-Wall-Interaction (POF3-174)},
      pid          = {G:(DE-HGF)POF3-174},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {33379941},
      UT           = {WOS:000597333200001},
      doi          = {10.1063/5.0012028},
      url          = {https://juser.fz-juelich.de/record/891760},
}