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@ARTICLE{Grewal:892885,
      author       = {Grewal, Abhishek and Wang, Yuqing and Münks, Matthias and
                      Kern, Klaus and Ternes, Markus},
      title        = {{L}ocal stiffness and work-function variations of hexagonal
                      boron nitride on {C}u(111)},
      reportid     = {FZJ-2021-02419},
      year         = {2021},
      abstract     = {Combined scanning tunnelling and atomic force microscopy
                      using a qPlus sensor enables the measurement of electronic
                      and mechanic properties of two dimensional (2D) materials at
                      the nanoscale. In this work we study hexagonal boron nitride
                      ( h -BN) , an atomically thin 2D layer, that is van der
                      Waals coupled to a Cu(111) surface. The system is of
                      interest as a decoupling layer for functional 2D
                      heterostructures due to the preservation of the h -BN
                      bandgap and as a template for atomic and molecular
                      adsorbates owing to its local electronic trapping potential
                      due to in-plane electric field. We obtain work-function (Φ)
                      variations on the h -BN/Cu(111) superstructure in the order
                      of 100 meV using two independent methods, namely the shift
                      of field emission resonances (FER) and contact potential
                      difference (CPD) measured by Kelvin probe force microscopy
                      (KPFM). Using 3D force profiles of the same area we
                      determine the relative stiffness of the $Moir\'e$ region
                      allowing us to analyze both electronic and mechanical
                      properties of the 2D layer simultaneously. We obtain a sheet
                      stiffness of 9.4 ± 0.9 nm which is an order of magnitude
                      higher than the one obtained for h -BN/Rh(111).Using
                      constant force maps we are able to derive height profiles of
                      the h -BN/Cu(111) showing that the system has a corrugation
                      of 0.6 ± 0.2 Å which helps demystify discussion around the
                      flatness of the h -BN/Cu(111) substrate.},
      cin          = {PGI-3},
      cid          = {I:(DE-Juel1)PGI-3-20110106},
      pnm          = {521 - Quantum Materials (POF4-521)},
      pid          = {G:(DE-HGF)POF4-521},
      typ          = {PUB:(DE-HGF)25},
      doi          = {10.3762/bxiv.2021.30.v1},
      url          = {https://juser.fz-juelich.de/record/892885},
}