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@ARTICLE{Das:893095,
author = {Das, Basita and Liu, Zhifa and Aguilera, Irene and Rau, Uwe
and Kirchartz, Thomas},
title = {{D}efect tolerant device geometries for lead-halide
perovskites},
journal = {Materials advances},
volume = {2},
number = {11},
issn = {2633-5409},
address = {Cambridge},
publisher = {Royal Society of Chemistry},
reportid = {FZJ-2021-02554},
pages = {3655},
year = {2021},
abstract = {The term “defect tolerance” is widely used in the
literature to describe materials such as lead-halides
perovskites, where solution-processed polycrystalline thin
films exhibit long non-radiative lifetimes of microseconds
or longer. Studies on defect tolerance of materials mostly
look at the properties of the host material and/or the
chemical nature of defects that affect their capture
coefficients. However, the recombination activity of a
defect is not only a function of its capture coefficients
but also depends on the electrostatics and the design of the
layer stack of a photovoltaic device. Here we study the
influence of device geometry on defect tolerance by
combining calculations of capture coefficients with device
simulations. We derive generic device design principles
which can inhibit recombination inside a photovoltaic device
for a given set of capture coefficients based on the idea of
slowing down the slower of the two processes (electron and
hole capture) even further by modifying electron and hole
injection into the absorber layer. We use the material
parameters and typical p–i–n device geometry
representing methylammonium lead halide perovskites solar
cells to illustrate the application of our generic design
principles to improve specific devices.},
cin = {IEK-5},
ddc = {540},
cid = {I:(DE-Juel1)IEK-5-20101013},
pnm = {121 - Photovoltaik und Windenergie (POF4-121)},
pid = {G:(DE-HGF)POF4-121},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000644707600001},
doi = {10.1039/D0MA00902D},
url = {https://juser.fz-juelich.de/record/893095},
}