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@ARTICLE{Rose:893264,
author = {Rose, M.-A. and Barnett, J. and Wendland, D. and Hensling,
F. V. E. and Boergers, J. M. and Moors, M. and Dittmann, R.
and Taubner, T. and Gunkel, F.},
title = {{L}ocal inhomogeneities resolved by scanning probe
techniques and their impact on local 2{DEG} formation in
oxide heterostructures},
journal = {Nanoscale advances},
volume = {3},
number = {14},
issn = {2516-0230},
address = {Cambridge},
publisher = {Royal Society of Chemistry},
reportid = {FZJ-2021-02654},
pages = {10.1039.D1NA00190F},
year = {2021},
abstract = {Lateral inhomogeneities in the formation of two-dimensional
electron gases (2DEG) directly influence their electronic
properties. Understanding their origin is an important
factor for fundamental interpretations, as well as high
quality devices. Here, we studied the local formation of the
buried 2DEG at LaAlO3/SrTiO3 (LAO/STO) interfaces grown on
STO (100) single crystals with partial TiO2 termination,
utilizing in situ conductive atomic force microscopy (c-AFM)
and scattering-type scanning near-field optical microscopy
(s-SNOM). Using substrates with different degrees of
chemical surface termination, we can link the resulting
interface chemistry to an inhomogeneous 2DEG formation. In
conductivity maps recorded by c-AFM, a significant lack of
conductivity is observed at topographic features, indicative
of a local SrO/AlO2 interface stacking order, while
significant local conductivity can be probed in regions
showing TiO2/LaO interface stacking order. These results
could be corroborated by s-SNOM, showing a similar contrast
distribution in the optical signal which can be linked to
the local electronic properties of the material. The results
are further complemented by low-temperature conductivity
measurements, which show an increasing residual resistance
at 5 K with increasing portion of insulating SrO-terminated
areas. Therefore, we can correlate the macroscopic
electrical behavior of our samples to their nanoscopic
structure. Using proper parameters, 2DEG mapping can be
carried out without any visible alteration of sample
properties, proving c-AFM and s-SNOM to be viable and
destruction-free techniques for the identification of local
2DEG formation. Furthermore, applying c-AFM and s-SNOM in
this manner opens the exciting prospect to link macroscopic
low-temperature transport to its nanoscopic origin.},
cin = {PGI-7 / JARA-FIT},
ddc = {540},
cid = {I:(DE-Juel1)PGI-7-20110106 / $I:(DE-82)080009_20140620$},
pnm = {523 - Neuromorphic Computing and Network Dynamics
(POF4-523)},
pid = {G:(DE-HGF)POF4-523},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000661486000001},
doi = {10.1039/D1NA00190F},
url = {https://juser.fz-juelich.de/record/893264},
}