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@ARTICLE{Beyer:893874,
      author       = {Beyer, Andreas and Munde, Manveer Singh and Firoozabadi,
                      Saleh and Heimes, Damien and Grieb, Tim and Rosenauer,
                      Andreas and Müller-Caspary, Knut and Volz, Kerstin},
      title        = {{Q}uantitative {C}haracterization of {N}anometer-{S}cale
                      {E}lectric {F}ields via {M}omentum-{R}esolved {STEM}},
      journal      = {Nano letters},
      volume       = {21},
      number       = {5},
      issn         = {1530-6992},
      address      = {Washington, DC},
      publisher    = {ACS Publ.},
      reportid     = {FZJ-2021-02886},
      pages        = {2018 - 2025},
      year         = {2021},
      abstract     = {Most of today’s electronic devices, like solar cells and
                      batteries, are based on nanometer-scale built-in electric
                      fields. Accordingly, characterization of fields at such
                      small scales has become an important task in the
                      optimization of these devices. In this study, with
                      GaAs-based p–n junctions as the example, key
                      characteristics such as doping concentrations, polarity, and
                      the depletion width are derived quantitatively using
                      four-dimensional scanning transmission electron microscopy
                      (4DSTEM). The built-in electric fields are determined by the
                      shift they introduce to the center-of-mass of electron
                      diffraction patterns at subnanometer spatial resolution. The
                      method is applied successfully to characterize two p–n
                      junctions with different doping concentrations. This
                      highlights the potential of this method to directly
                      visualize intentional or unintentional nanoscale electric
                      fields in real-life devices, e.g., batteries, transistors,
                      and solar cells.},
      cin          = {ER-C-1},
      ddc          = {660},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / moreSTEM - Momentum-resolved
                      Scanning Transmission Electron Microscopy (VH-NG-1317)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)VH-NG-1317},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {33621104},
      UT           = {WOS:000629091100016},
      doi          = {10.1021/acs.nanolett.0c04544},
      url          = {https://juser.fz-juelich.de/record/893874},
}