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@ARTICLE{Mahr:893877,
      author       = {Mahr, Christoph and Müller-Caspary, Knut and Grieb, Tim
                      and Krause, Florian and Schowalter, Marco and Rosenauer,
                      Andreas},
      title        = {{A}ccurate measurement of strain at interfaces in
                      4{D}-{STEM}: {A} comparison of various methods},
      journal      = {Ultramicroscopy},
      volume       = {221},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2021-02889},
      pages        = {113196 -},
      year         = {2021},
      abstract     = {Strain analysis by nano-beam electron diffraction allows
                      for measurements of strain with nanometre resolution in a
                      large field of view. This is done by evaluating distances
                      between diffraction discs in diffraction patterns acquired
                      while a focussed electron beam is scanned across the sample
                      in a transmission electron microscope. The bottleneck of
                      this method is a precise determination of diffraction disc
                      positions, which suffers from the inner structure of the
                      discs caused by dynamical diffraction. Electron beam
                      precession is a tool that solves this problem but it is not
                      commonly available in every microscope. Without precession
                      significant progress has been reported recently by using
                      patterned condenser apertures. The pattern of the aperture
                      is reproduced in patterns of the diffraction discs allowing
                      for a more precise position determination. In this report
                      the accuracy of measured strain profiles using patterned
                      apertures is investigated by evaluation of realistic
                      simulations. This is done especially at interfaces between
                      regions with different lattice plane spacing. It is found by
                      evaluation of the simulations that measured strain profiles
                      are more blurred and hence the accuracy at the interface is
                      worse the more patterns are imprinted to the condenser
                      aperture. An explanation of this effect is given and as a
                      proof of principle a solution to this problem is provided
                      applying geometric phase analysis ptychography},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / moreSTEM - Momentum-resolved
                      Scanning Transmission Electron Microscopy (VH-NG-1317) /
                      Ptychography 4.0 - Proposal for a pilot project "Information
                      $\&$ Data Science" (ZT-I-0025)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)VH-NG-1317 /
                      G:(DE-HGF)ZT-I-0025},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {33341079},
      UT           = {WOS:000612539600004},
      doi          = {10.1016/j.ultramic.2020.113196},
      url          = {https://juser.fz-juelich.de/record/893877},
}