% IMPORTANT: The following is UTF-8 encoded.  This means that in the presence
% of non-ASCII characters, it will not work with BibTeX 0.99 or older.
% Instead, you should use an up-to-date BibTeX implementation like “bibtex8” or
% “biber”.

@ARTICLE{Beyer:893892,
      author       = {Beyer, Andreas and Krause, Florian and Robert, Hoel L. and
                      Firoozabadi, Saleh and Grieb, Tim and Kükelhan, Pirmin and
                      Heimes, Damien and Schowalter, Marco and Müller-Caspary,
                      Knut and Rosenauer, Andreas and Volz, Kerstin},
      title        = {{I}nfluence of plasmon excitations on atomic-resolution
                      quantitative 4{D} scanning transmission electron microscopy},
      journal      = {Scientific reports},
      volume       = {10},
      number       = {1},
      issn         = {2045-2322},
      address      = {[London]},
      publisher    = {Macmillan Publishers Limited, part of Springer Nature},
      reportid     = {FZJ-2021-02904},
      pages        = {17890},
      year         = {2020},
      abstract     = {Scanning transmission electron microscopy (STEM) allows to
                      gain quantitative information on the atomic-scale structure
                      and composition of materials, satisfying one of todays major
                      needs in the development of novel nanoscale devices. The aim
                      of this study is to quantify the impact of inelastic, i.e.
                      plasmon excitations (PE), on the angular dependence of STEM
                      intensities and answer the question whether these
                      excitations are responsible for a drastic mismatch between
                      experiments and contemporary image simulations observed at
                      scattering angles below ∼ 40 mrad. For the two materials
                      silicon and platinum, the angular dependencies of elastic
                      and inelastic scattering are investigated. We utilize energy
                      filtering in two complementary microscopes, which are
                      representative for the systems used for quantitative STEM,
                      to form position-averaged diffraction patterns as well as
                      atomically resolved 4D STEM data sets for different energy
                      ranges. The resulting five-dimensional data are used to
                      elucidate the distinct features in real and momentum space
                      for different energy losses. We find different angular
                      distributions for the elastic and inelastic scattering,
                      resulting in an increased low-angle intensity (∼ 10–40
                      mrad). The ratio of inelastic/elastic scattering increases
                      with rising sample thickness, while the general shape of the
                      angular dependency is maintained. Moreover, the ratio
                      increases with the distance to an atomic column in the
                      low-angle regime. Since PE are usually neglected in image
                      simulations, consequently the experimental intensity is
                      underestimated at these angles, which especially affects
                      bright field or low-angle annular dark field imaging. The
                      high-angle regime, however, is unaffected. In addition, we
                      find negligible impact of inelastic scattering on
                      first-moment imaging in momentum-resolved STEM, which is
                      important for STEM techniques to measure internal electric
                      fields in functional nanostructures. To resolve the
                      discrepancies between experiment and simulation, we present
                      an adopted simulation scheme including PE. This study
                      highlights the necessity to take into account PE to achieve
                      quantitative agreement between simulation and experiment.
                      Besides solving the fundamental question of missing physics
                      in established simulations, this finally allows for the
                      quantitative evaluation of low-angle scattering, which
                      contains valuable information about the material
                      investigated.},
      cin          = {ER-C-1},
      ddc          = {600},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / moreSTEM - Momentum-resolved
                      Scanning Transmission Electron Microscopy (VH-NG-1317)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)VH-NG-1317},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {33087734},
      UT           = {WOS:000585143800023},
      doi          = {10.1038/s41598-020-74434-w},
      url          = {https://juser.fz-juelich.de/record/893892},
}