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@ARTICLE{Fatermans:893893,
      author       = {Fatermans, J. and den Dekker, A. J. and Müller-Caspary, K.
                      and Gauquelin, N. and Verbeeck, J. and Van Aert, S.},
      title        = {{A}tom column detection from simultaneously acquired {ABF}
                      and {ADF} {STEM} images},
      journal      = {Ultramicroscopy},
      volume       = {219},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2021-02905},
      pages        = {113046 -},
      year         = {2020},
      abstract     = {In electron microscopy, the maximum a posteriori (MAP)
                      probability rule has been introduced as a tool to determine
                      the most probable atomic structure from high-resolution
                      annular dark-field (ADF) scanning transmission electron
                      microscopy (STEM) images exhibiting low contrast-to-noise
                      ratio (CNR). Besides ADF imaging, STEM can also be applied
                      in the annular bright-field (ABF) regime. The ABF STEM mode
                      allows to directly visualize light-element atomic columns in
                      the presence of heavy columns. Typically, light-element
                      nanomaterials are sensitive to the electron beam, limiting
                      the incoming electron dose in order to avoid beam damage and
                      leading to images exhibiting low CNR. Therefore, it is of
                      interest to apply the MAP probability rule not only to ADF
                      STEM images, but to ABF STEM images as well. In this work,
                      the methodology of the MAP rule, which combines statistical
                      parameter estimation theory and model-order selection, is
                      extended to be applied to simultaneously acquired ABF and
                      ADF STEM images. For this, an extension of the commonly used
                      parametric models in STEM is proposed. Hereby, the effect of
                      specimen tilt has been taken into account, since small tilts
                      from the crystal zone axis affect, especially, ABF STEM
                      intensities. Using simulations as well as experimental data,
                      it is shown that the proposed methodology can be
                      successfully used to detect light elements in the presence
                      of heavy elements.},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / moreSTEM - Momentum-resolved
                      Scanning Transmission Electron Microscopy (VH-NG-1317)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)VH-NG-1317},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {32927326},
      UT           = {WOS:000594768500005},
      doi          = {10.1016/j.ultramic.2020.113046},
      url          = {https://juser.fz-juelich.de/record/893893},
}