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@ARTICLE{Mahr:893899,
      author       = {Mahr, Christoph and Müller-Caspary, Knut and Ritz, Robert
                      and Simson, Martin and Grieb, Tim and Schowalter, Marco and
                      Krause, Florian and Lackmann, Anastasia and Soltau, Heike
                      and Wittstock, Arne and Rosenauer, Andreas},
      title        = {{I}nfluence of distortions of recorded diffraction patterns
                      on strain analysis by nano-beam electron diffraction},
      journal      = {Ultramicroscopy},
      volume       = {196},
      issn         = {0304-3991},
      address      = {Amsterdam},
      publisher    = {Elsevier Science},
      reportid     = {FZJ-2021-02911},
      pages        = {74 - 82},
      year         = {2019},
      abstract     = {Images acquired in transmission electron microscopes can be
                      distorted for various reasons such as e.g. aberrations of
                      the lenses of the imaging system or inaccuracies of the
                      image recording system. This results in inaccuracies of
                      measures obtained from the distorted images. Here we report
                      on measurement and correction of elliptical distortions of
                      diffraction patterns. The effect of this correction on the
                      measurement of crystal lattice strain is investigated. We
                      show that the effect of the distortions is smaller than the
                      precision of the measurement in cases where the strain is
                      obtained from shifts of diffracted discs with respect to
                      their positions in images acquired in an unstrained
                      reference area of the sample. This can be explained by the
                      fact that diffraction patterns acquired in the strain free
                      reference area of the sample are distorted in the same
                      manner as the diffraction patterns acquired in the strained
                      region of interest. In contrast, for samples without a
                      strain free reference region such as nanoparticles or
                      nanoporous structures, where we evaluate ratios of lattice
                      plane distances along different directions, the distortions
                      are usually not negligible. Furthermore, two techniques for
                      the detection of diffraction disc positions are compared
                      showing that for samples in which the crystal orientation
                      changes over the investigated area it is more precise to
                      detect the positions of many diffraction discs
                      simultaneously instead of detecting each disc position
                      independently.},
      cin          = {ER-C-1},
      ddc          = {570},
      cid          = {I:(DE-Juel1)ER-C-1-20170209},
      pnm          = {5351 - Platform for Correlative, In Situ and Operando
                      Characterization (POF4-535) / moreSTEM - Momentum-resolved
                      Scanning Transmission Electron Microscopy (VH-NG-1317)},
      pid          = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)VH-NG-1317},
      typ          = {PUB:(DE-HGF)16},
      pubmed       = {30291992},
      UT           = {WOS:000451180800011},
      doi          = {10.1016/j.ultramic.2018.09.010},
      url          = {https://juser.fz-juelich.de/record/893899},
}