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@ARTICLE{Barthel:897341,
      author       = {Barthel, Juri and Allen, Leslie J.},
      title        = {{R}ole of ionization in imaging and spectroscopy utilizing
                      fast electrons that have excited phonons},
      journal      = {Physical review / B},
      volume       = {104},
      number       = {10},
      issn         = {2469-9950},
      address      = {Woodbury, NY},
      publisher    = {Inst.},
      reportid     = {FZJ-2021-03741},
      pages        = {104108},
      year         = {2021},
      abstract     = {Atomic resolution scanning transmission electron
                      microscopy, based on counting fast electrons that have been
                      scattered to large angles after exciting a phonon, so-called
                      high-angle annular dark-field (HAADF) imaging, is widely
                      used in materials science. Recently atomic resolution phonon
                      spectroscopy has been demonstrated. In both cases
                      experiments are usually modeled taking into account only
                      elastic scattering and the inelastic scattering due to
                      phonon excitation. However, other inelastic processes, such
                      as plasmon excitation and single electron excitation, also
                      play a role. In this paper we will focus on the role of
                      ionization and its influence on imaging and spectroscopy
                      based on phonon excitation. Inelastic scattering due to
                      ionization is mainly forward peaked, which has implications
                      for phonon spectroscopy with a detector in the forward
                      direction. Nevertheless, a substantial fraction of electrons
                      scattered by phonon excitation to larger angles have also
                      lost significant amounts of energy due to also being
                      involved in an ionization event. We discuss the implications
                      of this for HAADF imaging and phonon spectroscopy utilizing
                      electrons scattered to these larger angles.},
      cin          = {ER-C-2},
      ddc          = {530},
      cid          = {I:(DE-Juel1)ER-C-2-20170209},
      pnm          = {5353 - Understanding the Structural and Functional Behavior
                      of Solid State Systems (POF4-535)},
      pid          = {G:(DE-HGF)POF4-5353},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000704414400001},
      doi          = {10.1103/PhysRevB.104.104108},
      url          = {https://juser.fz-juelich.de/record/897341},
}