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@ARTICLE{Barthel:897341,
author = {Barthel, Juri and Allen, Leslie J.},
title = {{R}ole of ionization in imaging and spectroscopy utilizing
fast electrons that have excited phonons},
journal = {Physical review / B},
volume = {104},
number = {10},
issn = {2469-9950},
address = {Woodbury, NY},
publisher = {Inst.},
reportid = {FZJ-2021-03741},
pages = {104108},
year = {2021},
abstract = {Atomic resolution scanning transmission electron
microscopy, based on counting fast electrons that have been
scattered to large angles after exciting a phonon, so-called
high-angle annular dark-field (HAADF) imaging, is widely
used in materials science. Recently atomic resolution phonon
spectroscopy has been demonstrated. In both cases
experiments are usually modeled taking into account only
elastic scattering and the inelastic scattering due to
phonon excitation. However, other inelastic processes, such
as plasmon excitation and single electron excitation, also
play a role. In this paper we will focus on the role of
ionization and its influence on imaging and spectroscopy
based on phonon excitation. Inelastic scattering due to
ionization is mainly forward peaked, which has implications
for phonon spectroscopy with a detector in the forward
direction. Nevertheless, a substantial fraction of electrons
scattered by phonon excitation to larger angles have also
lost significant amounts of energy due to also being
involved in an ionization event. We discuss the implications
of this for HAADF imaging and phonon spectroscopy utilizing
electrons scattered to these larger angles.},
cin = {ER-C-2},
ddc = {530},
cid = {I:(DE-Juel1)ER-C-2-20170209},
pnm = {5353 - Understanding the Structural and Functional Behavior
of Solid State Systems (POF4-535)},
pid = {G:(DE-HGF)POF4-5353},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000704414400001},
doi = {10.1103/PhysRevB.104.104108},
url = {https://juser.fz-juelich.de/record/897341},
}