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@MISC{Strauch:897404,
author = {Strauch, Achim and Clausen, Alexander and Weber, Dieter and
Müller-Caspary, Knut},
title = {{H}igh-resolution 4{D} {STEM} dataset of {S}r{T}i{O}3 along
the [1 0 0] axis at high magnification},
reportid = {FZJ-2021-03770},
year = {2021},
abstract = {<p>This dataset can be used to test various analysis
methods for high-resolution 4D STEM, $including\ phase$
contrast methods such as ptychography. Scan and diffraction
coordinates have been calibrated. The high scan
magnification allows to identify individual atoms and easily
distinguish them from reconstruction artifacts.</p> <p>Data
was acquired at a probe-corrected FEI Titan 80-300 STEM
operated at 300 kV. The microscope was equipped with a
Medipix Merlin for EM detector operated at an acquisition
rate for individual diffraction patterns of 1 kHz. The scan
size was 128 x $128\ scan$ points and the recorded
diffraction patterns had a dimension of 256 x
$256\ pixel.</p>$ <p>The convergence angle of the
incident probe was measured with a polycrystalline gold
specimen. Employing parallel illumination first, the (111)
gold diffraction ring was used to calibrate the diffraction
space assuming a lattice constant of gold of 0.4083 nm. With
the known wavelength the convergence semi-angle was
determined to 22.1 mrad from a Ronchigram recorded in the
same STEM setting as used in the actual experiment. The
convergence semi-angle in pixel was determined from the size
of the primary beam on the detector.</p> <p>The rotation and
handedness of the detector coordinate system with respect to
the scan axes was determined by minimizing the curl of the
first moment vector field and making sure that the
divergence of the field is negative at atom positions. Note
that, in theory, the curl of purely electrostatic fields
should vanish. The pixel size in the scan dimension
$of\ 12.7$ pm was taken from the STEM control software
during live processing and verified by comparison with the
known lattice constant of SrTiO<sub>3</sub>. The residual
scan distortion, that is, the translation of the diffraction
pattern as a whole during scanning, was not compensated for
since it turned out to be negligible at the
atomic-resolution STEM magnifications used in this
analysis.</p> <p>The sample thickness was approximately 25
nm, determined by comparing the PACBED with simulation.</p>
<p><strong>Parameters</strong></p> <p>Scan pixel
$size:\ 12.7$ pm</p> <p>Center y: 126 px</p> <p>Center
x: 123 px</p> <p>Convergence semi-angle: 22.13 mrad, 15.5
px</p> <p>Thickness: approx. 25 nm</p> <p>Affine
transformation of the direction of scan coordinates to
detector coordinates using
https://github.com/LiberTEM/LiberTEM/blob/master/src/libertem/corrections/coordinates.py:</p>
<pre>transformation $=\ rotate_deg(88)$ @ $flip_y()$
$det_sy,$ $det_sx$ = $((scan_sy,$ $scan_sx)$ @
transformation)</pre> <p>See the included notebook for an
exemplary analysis.
$See\ https://arxiv.org/abs/2106.13457$ for more
details.</p>},
cin = {ER-C-1},
cid = {I:(DE-Juel1)ER-C-1-20170209},
pnm = {5351 - Platform for Correlative, In Situ and Operando
Characterization (POF4-535) / moreSTEM - Momentum-resolved
Scanning Transmission Electron Microscopy (VH-NG-1317) /
Ptychography 4.0 - Proposal for a pilot project "Information
$\&$ Data Science" (ZT-I-0025)},
pid = {G:(DE-HGF)POF4-5351 / G:(DE-HGF)VH-NG-1317 /
G:(DE-HGF)ZT-I-0025},
typ = {PUB:(DE-HGF)33},
doi = {10.5281/ZENODO.5113449},
url = {https://juser.fz-juelich.de/record/897404},
}