%0 Journal Article %A Giesen, Margret %A Jugovac, Matteo %A Zamborlini, Giovanni %A Feyer, Vitaliy %A Gunkel, Felix %A Mueller, David N. %T Corrigendum to “Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]” %J Thin solid films %V 729 %@ 0040-6090 %C Amsterdam [u.a.] %I Elsevier %M FZJ-2021-04593 %P 138694 - %D 2021 %F PUB:(DE-HGF)16 %9 Journal Article %U <Go to ISI:>//WOS:000653013100004 %R 10.1016/j.tsf.2021.138694 %U https://juser.fz-juelich.de/record/902836