%0 Journal Article
%A Giesen, Margret
%A Jugovac, Matteo
%A Zamborlini, Giovanni
%A Feyer, Vitaliy
%A Gunkel, Felix
%A Mueller, David N.
%T Corrigendum to “Principal Component Analysis: Reveal Camouflaged Information in X-Ray Absorption Spectroscopy Photoemission Electron Microscopy of Complex Thin Oxide Films [Thin Solid Films 65 (2018) 75-84]”
%J Thin solid films
%V 729
%@ 0040-6090
%C Amsterdam [u.a.]
%I Elsevier
%M FZJ-2021-04593
%P 138694 -
%D 2021
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000653013100004
%R 10.1016/j.tsf.2021.138694
%U https://juser.fz-juelich.de/record/902836